26 Jun 2025

Junction Bias, Current, Resistance, and Capacitance

Forward and reverse bias, diode current mechanisms, V-I characteristic, small-signal resistance, and junction capacitance.

bsc semester-iv mj-7 semiconductor-devices diode-characteristic junction-capacitance

Define the applied junction voltage by

\[V=V_p-V_n.\]

Forward bias means $V>0$: the p terminal is at the higher potential, so the barrier is reduced from $V_{bi}$ to $V_{bi}-V$. Reverse bias means $V<0$ and increases the barrier to $V_{bi}+\lvert V\rvert$. In the depletion approximation,

\[\boxed{W(V)=\sqrt{\frac{2\varepsilon_s}{q} \left(\frac1{N_A}+\frac1{N_D}\right)(V_{bi}-V)}}.\]

This expression requires $V<V_{bi}$ and fails in strong forward injection or breakdown.

Current-flow mechanism

Forward bias injects electrons from n into p and holes from p into n. At the depletion edges, the ideal low-injection boundary concentrations are

\[n_p(0)=n_{p0}e^{V/V_T}, \qquad p_n(0)=p_{n0}e^{V/V_T},\]

where $n_{p0}=n_i^2/N_A$ and $p_{n0}=n_i^2/N_D$. The injected minority carriers diffuse through the neutral regions and recombine. For long quasi-neutral regions, $W_p\gg L_n$ and $W_n\gg L_p$, or equivalent remote-contact boundary conditions, solving their steady diffusion equations gives

\[\boxed{I=I_S\!\left(e^{V/(\eta V_T)}-1\right)}.\]

For the ideal diffusion model, $\eta=1$ and

\[I_S=qA\left(\frac{D_n n_{p0}}{L_n}+\frac{D_p p_{n0}}{L_p}\right),\]

where $A$ is junction area in $\mathrm{m^2}$, $D$ is diffusivity in $\mathrm{m^2\,s^{-1}}$, and $L$ is diffusion length in metres; $I_S$ is therefore in amperes. For finite neutral widths the corresponding terms acquire $\coth(W/L)$ factors. Depletion-region recombination commonly gives an effective $\eta$ approaching 2.

Under reverse bias with $\lvert V\rvert\gtrsim3\eta V_T$ but below breakdown, thermally generated minority carriers are swept across the depletion layer and $I\simeq-I_S$. At breakdown the reverse current is instead limited by the external circuit. At large forward current, series resistance and high-level injection cause departure from the exponential law.

Exact normalized Shockley p-n diode current-voltage characteristic
The ideal Shockley characteristic on normalized axes. Positive $I$ is conventional current from p to n; the graph excludes breakdown and series resistance.

The editable source is diode-characteristic.tex.

Static and dynamic resistance

At a chosen operating point $(V,I)$, the dc or static resistance and the local small-signal resistance are different:

\[\boxed{R_{\rm dc}=\frac VI}, \qquad \boxed{r_d=\left(\frac{dI}{dV}\right)^{-1} =\frac{\eta V_T}{I+I_S} \simeq\frac{\eta V_T}{I}}.\]

The last approximation requires strong forward bias, $I\gg I_S$. Both resistances have units ohms, but $r_d$ is the reciprocal slope at the operating point and governs only sufficiently small signal changes.

Junction and diffusion capacitance

The magnitude of depletion charge is $Q=qAN_Ax_p=qAN_Dx_n$. The depletion or transition capacitance is

\[\boxed{C_j=\left\lvert\frac{dQ}{dV}\right\rvert=\frac{\varepsilon_sA}{W} =\frac{C_{j0}}{\sqrt{1-V/V_{bi}}}}, \qquad C_{j0}=\frac{\varepsilon_sA}{W_0}.\]

Thus reverse bias widens the layer and reduces $C_j$. This square-root law is for an abrupt junction; a graded junction has a different exponent. Under appreciable forward bias, stored injected charge adds a diffusion capacitance. If the stored charge is approximately $Q_s\simeq\tau_T I$,

\[\boxed{C_d=\frac{dQ_s}{dV}\simeq\frac{\tau_T I}{\eta V_T}},\]

where $\tau_T$ is an effective carrier transit or storage time in seconds. The small-signal terminal capacitance is approximately $C_j+C_d$ before parasitic package capacitances are included.

Solved Problems

1. Forward current and the local diode resistance

A diode has $I_S=10.0\,\mathrm{nA}$, $\eta=1.50$, and $V_T=25.9\,\mathrm{mV}$. Find its current, static resistance, and dynamic resistance at $V=0.300\,\mathrm V$.

\[\frac{V}{\eta V_T}=\frac{0.300}{(1.50)(0.0259)}=7.722,\] \[I=10.0\,\mathrm{nA}\,[e^{7.722}-1]=22.56\,\mu\mathrm A.\]

Thus

\[R_{dc}=\frac{0.300}{22.56\,\mu\mathrm A}=13.30\,\mathrm{k\Omega},\] \[r_d=\frac{(1.50)(0.0259)}{I+I_S}=1.721\,\mathrm{k\Omega}.\]

The much smaller $r_d$ is the tangent resistance, not a contradiction: the exponential curve steepens as the bias increases. Substitution gives $r_d(dI/dV)=1$.

2. Reverse-bias depletion and forward-bias storage capacitance

An abrupt junction has $W_0=0.600\,\mu\mathrm m$, $C_{j0}=40.0\,\mathrm{pF}$, and $V_{bi}=0.720\,\mathrm V$. At $V=-5.00\,\mathrm V$,

\[W=W_0\sqrt{1-\frac{V}{V_{bi}}} =0.600\sqrt{1+\frac{5.00}{0.720}} =1.691\,\mu\mathrm m,\] \[C_j=\frac{40.0}{\sqrt{1+5.00/0.720}}=14.19\,\mathrm{pF}.\]

Reverse bias therefore increases $W$ and decreases $C_j$, with $WC_j=W_0C_{j0}$ in this model. Separately, at forward current $I=2.00\,\mathrm{mA}$ with $\tau_T=2.00\,\mu\mathrm s$, $\eta=1.50$, and $V_T=25.9\,\mathrm{mV}$,

\[C_d\simeq\frac{\tau_TI}{\eta V_T}=0.10296\,\mu\mathrm F=103\,\mathrm{nF}.\]

This much larger value reflects stored injected charge under forward bias, not depletion charge.

Descriptive Questions

  1. Explain how forward and reverse bias change the junction barrier and depletion width.
  2. Derive the Shockley diode equation from minority-carrier boundary conditions and state the long-neutral-region assumption.
  3. Distinguish static and dynamic diode resistance and specify the signal range for which $r_d$ is useful.
  4. Compare depletion and diffusion capacitance in origin, bias dependence, and dominant operating regime.

Numerical Problems

  1. For a long-base diode use $A=0.500\,\mathrm{mm^2}$, $q=1.60\times10^{-19}\,\mathrm C$, $n_i=1.00\times10^{16}\,\mathrm{m^{-3}}$, $N_A=2.00\times10^{22}\,\mathrm{m^{-3}}$, $N_D=5.00\times10^{21}\,\mathrm{m^{-3}}$, $D_n=3.00\times10^{-3}\,\mathrm{m^2\,s^{-1}}$, $D_p=1.00\times10^{-3}\,\mathrm{m^2\,s^{-1}}$, $L_n=30.0\,\mu\mathrm m$, and $L_p=20.0\,\mu\mathrm m$. Find the electron and hole contributions to $I_S$ and their sum.

    Final answer: $n_{p0}=5.00\times10^9\,\mathrm{m^{-3}}$ and $p_{n0}=2.00\times10^{10}\,\mathrm{m^{-3}}$. Therefore $I_{S,n}=0.0400\,\mathrm{pA}$, $I_{S,p}=0.0800\,\mathrm{pA}$, and $I_S=0.120\,\mathrm{pA}=1.20\times10^{-13}\,\mathrm A$.

  2. A diode with $I_S=5.00\,\mathrm{nA}$ and $\eta=2$ is biased at $V=-0.200\,\mathrm V$ at $300\,\mathrm K$. Find its current.

    Final answer: $I=5.00\,\mathrm{nA}[e^{-0.200/(2\times0.0259)}-1]=-4.895\,\mathrm{nA}$, close to the reverse-saturation value $-I_S$.

  3. At a strong-forward-bias point where $I\gg I_S$, a curve tracer measures $I=1.00\,\mathrm{mA}$ and differential conductance $g_d=dI/dV=25.0\,\mathrm{mS}$. With $V_T=25.0\,\mathrm{mV}$, infer $r_d$ and $\eta$. What current amplitude is produced by a sufficiently small $2.00\,\mathrm{mV}$ voltage amplitude?

    Final answer: $r_d=1/g_d=40.0\,\Omega$ and $\eta=I/(g_dV_T)=1.60$. The small-signal current amplitude is $\Delta i=g_d\Delta v=50.0\,\mu\mathrm A$.

  4. An abrupt junction gives $C_j=30.0\,\mathrm{pF}$ at $V=-2.25\,\mathrm V$ and $20.0\,\mathrm{pF}$ at $V=-6.00\,\mathrm V$. Use the abrupt-junction law to infer $V_{bi}$ and $C_{j0}$, then predict $C_j$ at $V=-11.25\,\mathrm V$.

    Final answer: Squaring the capacitance ratio gives $9/4=(V_{bi}+6)/(V_{bi}+9/4)$, hence $V_{bi}=3/4=0.750\,\mathrm V$. Either measurement gives $C_{j0}=60.0\,\mathrm{pF}$, and $C_j(-11.25\,\mathrm V)=60/\sqrt{16}=15.0\,\mathrm{pF}$.

The exponential law, resistance derivative, capacitance identities, and all numerical values are reproducible in pn-junction-bias-check.mac; every printed residual is zero.

References

  1. Wikipedia, “Diode”.
  2. MIT OpenCourseWare 6.012, Lecture 6: The p-n Junction Diode.
  3. NPTEL, IIT Delhi, Semiconductor Devices: Forward- and Reverse-Biased PN Junction.
© Rajesh Kumar, SKMU · Physics Lecture Notes · rajeshphy.github.io

Discussion

Share This Page